Thin films of tungsten-doped vanadium(IV) oxide were prepared on glass substrates from the atmospheric pressure chemical vapor deposition of vanadium(IV) chloride, tungsten-(VI) ethoxide, and water at 500-600 °C. The films were characterized by Raman microscopy, glancing angle X-ray diffraction (GAXRD), X-ray photoelectron spectroscopy (XPS), Rutherford backscattering (RBS), scanning electron microscopy (SEM), and vis/IR reflectancetransmittance. The films showed a reduction in thermochromic transition temperatures from 68 °C in VO 2 to 42 °C in V 0.99 W 0.01 O 2 sapproaching that required for commercial use as an intelligent window coating.

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0.99 W 0.01 O 2 are prepared on glass substrates from the atmospheric pressure CVD of VCl4, W(OEt)6, and H2O at 500-600°C. The samples are characterized by XRD, XPS, SEM, Raman, and UV/VIS spectroscopy. The films show a reduction in thermochromic transition temperatures from 68°C in VO 2 to 42°C in V 0.99 W 0.01 O 2 . They show many of the properties necessary for commercial applications as intelligent window coatings, such as a transition temperature approaching room temperature and large changes in IR transmittance and reflectance, with minimal changes in visible properties, on passing through the metal-to-semiconductor transition. -(MANNING, T. D.; PARKIN*, I. P.; PEMBLE, M. E.; SHEEL, D.; VERNARDOU, D.; Chem. Mater. 16 (2004) 4, 744-749; Dep. Chem., Univ. Coll., London WC1H 0AJ, UK; Eng.) -W. Pewestorf 18-012