Electronic devices exposed to high level electromagnetic interference with certain amplitude will fail with a certain probability. Knowing this failure probability is essential when a system is being designed to withstand intentional electromagnetic interference (IEMI). Based on this knowledge additional redundancy can be included in order to reduce the risk. In previous investigations [1] failure probability was analyzed for the case where a device was illuminated from one direction only. If the device is illuminated from other (random) directions, then the failure probability will change. In this contribution it is discussed how the failure probability determined for one direction can be extended in order to include a random angle of incidence of the interference. The main focus of this contribution is on failure probability caused by pulsed wideband signals. However, the approach presented here can also be extended to narrowband signals.

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This paper concentrates on the usage of the IEC 61000-4-20, the international standard for emission and immunity testing in transverse electromagnetic (TEM) waveguides. The specifications for transient testing in TEM waveguides according to Annex C of the norm are verified by measurements with different waveguides (GTEM 1250 and GTEM 3750) and various excitation signals with a large bandwidth up to several GHz. The measurement results show that the norm can be enlarged related to the defined limits of the applied test signals and the usable testing volume in the waveguide.