In this paper we develop and compare several multiresolution microscope slide scanning algorithms of increasing complexity. The algorithms utilise a lowresolution image of the whole sample to optimise the high-resolution scan in terms of decreasing the number of field-of-view (FOV) images required. This approach, while commonly applied in microscopy, has never been fully evaluated to quantify expected improvements in scan time when the high-resolution scans are optimised on each sample. In addition, the methods have potential to improve image quality by reducing both image stitching and focus tracking artefacts.
This paper compares several camera calibration methods on the estimation of specific extrinsic and intrinsic parameters. Good estimates of the chosen parameters, rotation and radial lens distortion are essential to increase the accuracy of quantitative measurements and to accurately stitch single field of view-based images together. The parameters are obtained using two selected methods on different objective magnifications on a microscope system using a fixed grid calibration pattern. We evaluate two methods and show that the rotation angles from one of the methods is consistent with a simple homography while the other estimates a consistently smaller angle. The radial distortion estimates are both very small and relate to a distortion of less than one pixel.
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