Imaging of soft matter, including polymeric and biological materials, has always been one of the big challenges in electron microscopy, due to the electrically insulating properties and radiation/vacuum-sensitive nature of such specimens. We briefly highlight recent advances that enable high-resolution characterization of soft nano-materials, in the native state, using scanning electron microscopy (SEM) and environmental SEM (ESEM).

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

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