We investigate the temporal and spatial scales of resistance fluctuations (R-fluctuations) at the superconducting resistive transition in thin epitaxial TiN films, accessed through voltage fluctuations measurements in current-biased samples. The measured Lorentzian spectrum of the R-fluctuations identifies their correlation time, which is shown to coincide with the thermal relaxation time determined by a combination of the electron-phonon relaxation and the diffusion in reservoirs. Our data is quantitatively consistent with the model of spontaneous temperature fluctuations, the Tfluctuations, with a variance given by the textbook thermodynamic expression. We discuss the experimental indication that the T -fluctuations contribute to the broadening of the transition, in spite of vanishing in the limit of infinite sample volume. Our observations highlight important caveats in the accepted physical picture of the resistive transition.

We investigate the impact of various fluctuation mechanisms on the time-averaged resistance and noise performance in superconducting devices based on epitaxial titanium nitride (TiN) films. We show that a very large noise at the resistive transition originates from spontaneous resistance (R) fluctuations. These fluctuations are characterized by a Lorentzian spectrum and a correlation time equal to that of electron energy relaxation time. The observed R-fluctuations in turn originate from temperature (T ) fluctuations due to spontaneous energy exchange between the electron system and the thermal bath. We present a model that describes the broadening of the resistive transition by T -fluctuations, and agrees well with data for thicker TiN samples. In thinner films, we propose an additional effect of surface magnetic disorder that can explain the deviations from the model. Our results point to new mechanisms that can significantly affect resistive properties of superconductors.