We demonstrate the utility of resonant soft x-ray scattering in characterizing heterogeneous chemical structure at nanometer length scales in polymer films and nanostructures. Resonant enhancements near the carbon K edge bring bond specific contrast and increased sensitivity to bridge a gap between x-ray absorption contrast in chemical sensitive imaging and higher spatial resolution hard x-ray and neutron small-angle scattering. Chemical bond sensitivity is illustrated in the scattering from latex spheres of differing chemistry and size. Resonant enhancements are then shown to yield sensitivity to heterogeneity in two-phase polymer films for which hard x-ray and nondeuterated neutron scattering lack sensitivity due to low contrast.

The energy distribution of the nitrogen antibonding electron states in the hexagonal epitaxial layers of AlN, GaN, and InN and cubic epitaxial layers of GaN and InN along pxy plane and pz direction is reported. The study was performed by the polarized x-ray absorption at the K edge of N. A strong polarization dependence of the absorption spectra indicating the significant anisotropy of the conduction band was found in the case of hexagonal samples. Very weak polarization dependencies observed in cubic samples correspond well with the defect distribution anisotropy. Qualitatively different and cation dependent antibonding states distribution point out the role played by a contribution of hybridized cation-nitrogen electronic states to the individual conduction band structures of AlN, GaN, and InN.

Helium (He)-2 Atomic Weight = 4.00 p (barnslatom) = ,u(cm2Ig) x 6.65 Ep(E) = 10511.7 f 2 keV crn2lg 87 94

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