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In the present contribution a method is presented which enables to perform absorption and fluorescence corrections in X-ray spectroscopy of transparent specimens. The method is based on several measurement at different sites of the same specimen, but does not require input parameters or coefficients. Moreover the possibility to deduce the mass thickness in every analysed area from the acquired experimental data will be discussed

In many new application areas it is necessary to combine atomic resolution imaging with atomic level chemical and crystallographic analysis. The new applications include microbiology, nanotubes, smart materials and sensor initiatives, and the myriad semiconductor fields. Along with these there are many other valuable applications in older and more established technologies such as chemicals, catalysis, pigments and construction materials for chemical plants, airplanes, pipelines, power generation, and other aspects of societal infrastructure. Analysis down to the atomic level will help to solve recalcitrant problems and open up some reluctant opportunities in these fields. They can be very effective in resolving important and long standing issues with huge potential monetary and societal costs and benefits. Key aspects of environmentally sensitive corrosion and pollution control may also require the support of similarly sophisticated imaging and microanalysis.We think the capabilities of a new generation high performance instrument should include atomic resolution coherent TEM imaging and also incoherent atomic number (Z) contrast high angle annular dark field (HAADF) STEM imaging.