Morphological properties of thermochromic VO2—porous silicon based hybrids reveal the growth of well-crystalized nanometer-scale features of VO2 as compared with typical submicron granular structure obtained in thin films deposited on flat substrates. Structural characterization performed as a function of temperature via grazing incidence X-ray diffraction and micro-Raman demonstrate reversible semiconductor-metal transition of the hybrid, changing from a low-temperature monoclinic VO2(M) to a high-temperature tetragonal rutile VO2(R) crystalline structure, coupled with a decrease in phase transition temperature. Effective optical response studied in terms of red/blue shift of the reflectance spectra results in a wavelength-dependent optical switching with temperature. As compared to VO2 film over crystalline silicon substrate, the hybrid structure is found to demonstrate up to 3-fold increase in the change of reflectivity with temperature, an enlarged hysteresis loop and a wider operational window for its potential application as an optical temperature sensor. Such silicon based hybrids represent an exciting class of functional materials to display thermally triggered optical switching culminated by the characteristics of each of the constituent blocks as well as device compatibility with standard integrated circuit technology.

Averaging and shifting the refractive index profiles of quasiperiodic structure reveals the formation of several localized modes in the reflectivity spectrum and were used to generate different spectral barcodes. By associating the depth and wavelength of the observed resonant modes to the thickness and position of blackbars, respectively, the possibility to generate multiple codes has been shown. An experimental verification was carried out with multilayered dielectric porous silicon structures with reflectivity spectra revealing unique photonic fingerprints.