Space-charge-limited current (SCLC) measurements have been widely used to study the charge carrier mobility and trap density in semiconductors. However, their applicability to metal halide perovskites is not straightforward, due to the mixed ionic and electronic nature of these materials. Here, we discuss the pitfalls of SCLC for perovskite semiconductors, and especially the effect of mobile ions. We show, using drift-diffusion (DD) simulations, that the ions strongly affect the measurement and that the usual analysis and interpretation of SCLC need to be refined. We highlight that the trap density and mobility cannot be directly quantified using classical methods. We discuss the advantages of pulsed SCLC for obtaining reliable data with minimal influence of the ionic motion. We then show that fitting the pulsed SCLC with DD modeling is a reliable method for extracting mobility, trap, and ion densities simultaneously. As a proof of concept, we obtain a trap density of 1.3 × 10 13 cm –3 , an ion density of 1.1 × 10 13 cm –3 , and a mobility of 13 cm 2 V –1 s –1 for a MAPbBr 3 single crystal.

Metal halide perovskite semiconductors have sprung to the forefront of research into optoelectronic devices and materials, largely because of their remarkable photovoltaic efficiency records above 25% in single-junction devices and 28% in tandem solar cells, achieved within a decade of research. Despite this rapid progress, ionic conduction within the semiconductor still puzzles the community and can have a significant impact on all metal halide perovskite-based optoelectronic devices because of its influence upon electronic and optoelectronic processes. This phenomenon thus also makes the interpretation of electrical characterization techniques, which probe the fundamental properties of these materials, delicate and complex. For example, space-charge limited current measurements are widely used to probe defect densities and carrier mobilities in perovskites. However, the influence of mobile ions upon these measurements is significant but has yet to be considered. Here we report the effect of mobile ions upon electronic conductivity during space-charge limited current measurements of MAPbBr 3 single crystals and show that conventional interpretations deliver erroneous results. We introduce a pulsed-voltage space-charge limited current procedure to achieve reproducible current−voltage characteristics without hysteresis. From this revised pulsed current−voltage sweep, we elucidate a lower bound trap-density value of 2.8 ± 1.8 × 10 12 cm −3 in MAPbBr 3 single crystals. This work will lead to more accurate characterization of halide perovskite semiconductors and ultimately more effective device optimization.

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Charge carrier mobility is a fundamental property of semiconductor materials that governs many electronic device characteristics. For metal halide perovskites, a wide range of charge carrier mobilities have been reported using different techniques. Mobilities are often estimated via transient methods assuming an initial charge carrier population after pulsed photoexcitation and measurement of photoconductivity via non-contact or contact techniques. For nanosecond to millisecond transient methods, early-time recombination and exciton-to-free-carrier ratio hinder accurate determination of free-carrier population after photoexcitation. By considering both effects, we estimate long-range charge carrier mobilities over a wide range of photoexcitation densities via transient photoconductivity measurements. We determine long-range mobilities for FA0.83Cs0.17Pb(I0.9Br0.1)3, (FA0.83MA0.17)0.95Cs0.05Pb(I0.9Br0.1)3 and CH3NH3PbI3-xClx polycrystalline films in the range of 0.3 to 6.7 cm2 V−1 s−1. We demonstrate how our data-processing technique can also reveal more precise mobility estimates from non-contact time-resolved microwave conductivity measurements. Importantly, our results indicate that the processing of polycrystalline films significantly affects their long-range mobility.