This paper presents an adapted partial element equivalent circuit (PEEC)-based methodology applied to the modeling of interconnections of power electronics devices. Although this method is already well known, the originality of this work is its use to model a device presenting an industrial complexity. To make possible this modeling, two adapted integral methods, based on two different meshings, are presented. They are dedicated respectively to the computation of parasitic inductances and capacitances and lead to an equivalent circuit of the system. From a time-domain simulation of this circuit, current and voltage sources can be extracted and used to compute the radiated near magnetic field. This approach has been applied to model a real industrial static converter via system couplings, a variable speed drive. Good agreements have been obtained between simulated and measured results on conducted and emitted electromagnetic analysis.Index Terms-Electromagnetic compatibility, fast multipole method, parasitic capacitances, parasitic elements, partial element equivalent circuit (PEEC), power electronics, power interconnections.

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This paper addresses the generation of accurate macromodels of digital ICs accounting for both the functional and the out-of-band behaviour of devices. The proposed models that can be effectively used for immunity predictions are obtained from port transient responses only and can be implemented in any commercial tool based on SPICE or mixedsignal hardware description languages. The approach is demonstrated on a real test board by injecting a RF noise disturbance into a digital IC: a systematic study comparing actual measurements and simulation predictions is carried out.

Some modelling methods and associated tools are presented in this paper to efficiently and accurately simulate the electromagnetic behaviour of power electronic structures. Moreover, as engineers have to face new challenges, the synergy between simulation tools is illustrated as a possible solution for addressing this "multiphysic" topic. The article is also pictured of several application examples where obtained results are discussed and compared to measurements.