Modeling and simulation is essential for predicting and verifying the behavior of fabricated quantum circuits, but existing simulation methods are either impractically costly or require an unrealistic simplification of error processes. We present a method of simulating noisy Clifford circuits that is both accurate and practical in experimentally relevant regimes. In particular, the cost is weakly exponential in the size and the degree of non-Cliffordness of the circuit. Our approach is based on the construction of exact representations of quantum channels as quasiprobability distributions over stabilizer operations, which are then sampled, simulated, and weighted to yield unbiased statistical estimates of circuit outputs and other observables. As a demonstration of these techniques we simulate a Steane [[7,1,3]]-encoded logical operation with non-Clifford errors and compute its fault tolerance error threshold. We expect that the method presented here will enable studies of much larger and more realistic quantum circuits than was previously possible.

In this paper we describe an ontology developed for a cyber security knowledge graph database. This is intended to provide an organized schema that incorporates information from a large variety of structured and unstructured data sources, and includes all relevant concepts within the domain. We compare the resulting ontology with previous efforts, discuss its strengths and limitations, and describe areas for future work.

Understanding transformations under electron beam irradiation requires mapping the structural phases and their evolution in real time. To date, this has mostly been a manual endeavor comprising of difficult frame-by-frame analysis that is simultaneously tedious and prone to error. Here, we turn towards the use of deep convolutional neural networks (DCNN) to automatically determine the Bravais lattice symmetry present in atomically-resolved images. A DCNN is trained to identify the Bravais lattice class given a 2D fast Fourier transform of the input image. Monte-Carlo dropout is used for determining the prediction probability, and results are shown for both simulated and real atomically-resolved images from scanning tunneling microscopy and scanning transmission electron microscopy. A reduced representation of the final layer output allows to visualize the separation of classes in the DCNN and agrees with physical intuition. We then apply the trained network to electron beam-induced transformations in WS2, which allows tracking and determination of growth rate of voids. These results are novel in two ways: (1) It shows that DCNNs can be trained to recognize diffraction patterns, which is markedly different from the typical 'real image' cases, and (2) it provides a method with in-built uncertainty quantification, allowing the real-time analysis of phases present in atomically resolved images.