An investigation into the impact of a single laboratory session team-based design experience early in the freshman year on student learning of the engineering design process is described. Assessment of the experience focused not only on gains in student perceptions of knowledge of and confidence in applying the engineering design process, but also on actual gains in knowledge, as judged by the investigators based on student written responses. The assessment data showed a significant overall increase in both student knowledge and confidence scores as well as significant individual incremental increases. The gains proved to be in particular significant when compared to those for the entire semester-long course. Design-step logs were used to monitor how students navigated through the engineering design process. While the students were exposed to a simplified linear design process in the lecture component of the class, the design logs indicated a more complex reality. Paths for instructional improvement on the topic of the engineering design process should include a discussion of the potentially complex nature of engineering design and a precise definition of terminology.

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e Synthesis Lectures on Digital Circuits and Systems series is comprised of 50-to 100-page books targeted for audience members with a wide-ranging background. e Lectures include topics that are of interest to students, professionals, and researchers in the area of design and analysis of digital circuits and systems. Each Lecture is self-contained and focuses on the background information required to understand the subject matter and practical case studies that illustrate applications. e format of a Lecture is structured such that each will be devoted to a specific topic in digital circuits and systems rather than a larger overview of several topics such as that found in a comprehensive handbook. e Lectures cover both well-established areas as well as newly developed or emerging material in digital circuits and systems design and analysis.

Systems are described for measuring the farand near-field radiation patterns from optical fibers. Parameters which affect measurement precision, accuracy, resolution, and signal-to-noise ratio are discussed. Measurements utilizing radiation patterns are covered; this includes radiation angle (numerical aperture), attenuation using mode filters, index profile, core diameter, and mode volume transfer function. Experimental examples are given in many instances.

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