We prepared by vapor deposition at room temperature thin (500 Å) Co/Pt multilayers or layered structures directly onto glass or Si substrates. They show a preferential magnetization perpendicular to the film plane for Co thicknesses below 12 Å and a 100% perpendicular remanence for Co thicknesses below 4.5 Å. The magnetic anisotropy can be explained by an interface contribution to the anisotropy. We also investigated the magneto-optical (MO) polar Kerr effect of these multilayers. Because of their excellent magnetic properties and their potentially high oxidation and corrosion resistance, these Co/Pt-layered structures are very promising candidates for MO recording. The Kerr rotation θk at λ=820 nm for a 35×(4.0 Å Co+12.7 Å Pt)-layered structure, which has 100% magnetic remanence, is modest (−0.12°), but the reflectivity R is high (70%), which results in a respectable figure of merit Rθ2k. Furthermore, the Kerr effect increases towards shorter wavelengths and thus favors future higher-density recording.

Defect impurity levels have been examined in copper-diffused p-and n-type silicon using deep level transient spectroscopy. Levels at Ev+0.09, Ev+0.23, and Ev+0.42 eV have been observed in both types of material, although the deeper levels were only oberved in n-type material after post-diffusion annealing at 200 °C. Associated with the appearance of these levels in n-type material was another level at Ec−0.16 eV. This may be a further charge state of the center responsible for the Ev+0.23 eV and Ev+0.42 eV levels or the two centers may be decomposition products of a thermally unstable complex. Luminescence measurements have revealed the previously reported Cu-Cu spectrum in all the copper-diffused samples. The occurrence of this signal could not be correlated with the presence of the levels at Ev+0.23, Ev+0.42, or Ec−0.16 eV; this leaves the center at Ev+0.09 eV as the likely origin of the signal.

The ferromagnetic resonance spectrum of a layered. magnetic thin film is expected to show a number of standing spin-wave resonances with a wavelength that matches the thickness of the film. For the case of perpendicular resonance such spectra were calculated for some typical films in which magnetic layers are alternated with weaker magnetic layers. Some useful approximations are discussed.. The results of the calculations are compared with experimental perpendicular spectra measured. on films in which fifty Permalloy layers alternate with Ni layers.