Piezoelectric ceramics are widely used in various applications such as lead zirconate titanate (PZT), especially after the development of acceptor or donor dopant. This is why all studies are interested in the effect of dopants on the properties of PZT ceramics are in great demand. In this work, the polycrystalline samples of Pb(0.95-x) La 0.03 Sm0.02 Bi x(Zr0.3,Ti0.7)O3 (x=0, 0.02, 0.04, 0.06, 0.08, 0.1) were prepared by a high-temperature solidstate reaction technique. Scanning electron micrograph (SEM) and X-ray diffraction (XRD) techniques was employed to examine the crystallization of the ceramics. The results of XRD show that the phase structure of the samples is tetragonal. The dielectric constant and the dielectric loss of the investigated samples decreased with increase in the frequency, then we can say that the doping with the Bi on PLSZT, enhances the dielectric and electrical properties. KEYWORDS: ferroelectric, microstructure, piezoelectric ceramics, dielectric properties. MOTS-CLÉS: ferroé lectrique, la microstructure, cé ramique pié zoé lectrique, proprié té s dié lectriques.