We analyze the spatial resolution of edge illumination X-ray phase-contrast imaging and its dependence upon various experimental parameters such as source size, source-to-sample and sample-to-detector distances, X-ray energy and size of the beam-shaping aperture. Different propagation regimes, as well as the beam divergence and polychromaticity encountered with laboratory sources, are also considered. We show that spatial resolution in edge illumination phase-contrast imaging presents peculiar features compared to other X-ray phase-contrast techniques. In particular, in the direction orthogonal to the s or mask lines used to shape the beam, this can be better than both the pixel dimension and the projected source size. Numerical simulations based on Fresnel diffraction integrals are presented, which confirm the analytical predictions. The obtained results allow a simple estimation of the spatial resolution for edge-illumination phase imaging in both synchrotron and laboratory setups.

A first-generation-synchrotron-class X-ray laboratory microsource, coupled to a three-pinhole camera, is presented. It allows (i) small-and wide-angle X-ray scattering images to be acquired simultaneously, and (ii) scanning small-and wide-angle X-ray scattering microscopy to be carried out. As representative applications, the structural complexity of a biological natural material (human bone biopsy) and of a metamaterial (colloidal nanocrystal assembly) are inspected at different length scales, studying the atomic/molecular ordering by (grazing-incidence) wide-angle X-ray scattering and the morphological/structural conformation by (grazing-incidence) small-angle X-ray scattering. In particular, the grazing-incidence measurement geometries are needed for inspecting materials lying on top of surfaces or buried underneath surfaces.

We present the translation of the beam tracking approach for x–ray phase–contrast and dark–field imaging, recently demonstrated using synchrotron radiation, to a laboratory setup. A single absorbing mask is used before the sample, and a local Gaussian interpolation of the beam at the detector is used to extract absorption, refraction, and dark–field signals from a single exposure of the sample. Multiple exposures can be acquired when high resolution is needed, as shown here. A theoretical analysis of the effect of polychromaticity on the retrieved signals, and of the artifacts this might cause when existing retrieval methods are used, is also discussed.

A method is proposed which enables the retrieval of the thickness or of the projected electron density of a sample from a single input image acquired with an edge illumination phase-contrast imaging setup. The method assumes the case of a quasi-homogeneous sample, i.e. a sample with a constant ratio between the real and imaginary parts of its complex refractive index. Compared with current methods based on combining two edge illumination images acquired in different configurations of the setup, this new approach presents advantages in terms of simplicity of acquisition procedure and shorter data collection time, which are very important especially for applications such as computed tomography and dynamical imaging. Furthermore, the fact that phase information is directly extracted, instead of its derivative, can enable a simpler image interpretation and be beneficial for subsequent processing such as segmentation. The method is first theoretically derived and its conditions of applicability defined. Quantitative accuracy in the case of homogeneous objects as well as enhanced image quality for the imaging of complex biological samples are demonstrated through experiments at two synchrotron radiation facilities. The large range of applicability, the robustness against noise and the need for only one input image suggest a high potential for investigations in various research subjects.