No abstract

No abstract

Ni0.7Zn0.3Fe2O4/Co0.8Fe2.2O4 (NZFO/CFO) multilayer films are fabricated on Si(100) substrates by the chemical solution deposition method. The microstructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 300 nm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices.