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Testing electronics for vulnerability to radio frequency (RF) radiation is time-consuming, due to the large number of source variables of interest. One typically searches for the minimum electric field that causes upset, as a function of center frequency, pulse width, pulse repetition frequency, number of pulses, and bandwidth. It is impossible to test all combinations of all the variables, so one must intelligently select the source parameters most likely to expose the greatest vulnerability. To select source parameters, we propose using standard techniques from minimization theory. Within a space of two or more variables, we search for the combination that upsets the system at the lowest power or field level. We investigated the vulnerability of media converters (MCs) to pulsed RF fields. We tested these devices by pinging a remote computer, and observing the field levels at which the pings failed to return.

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