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Abstract— Thermal models and tests of active‐matrix OLEDs (AMOLEDs) show that thermal effects can significantly reduce the lifetime of an OLED device. A comparison of the experimental heat distribution in an AMOLED with thermal models demonstrates that the thermal resistivity of the organic layers in an OLED is surprisingly high. Experiments with AMOLEDs show that the lifetime of OLED devices can be significantly improved through the use of heat‐spreading layers in the OLED devices.

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OLED devices age and become less efficient as they are used. The loss of light output comes from a decrease in current‐to‐photon conversion efficiency and from an increase in OLED resistance that results in a reduction of current through the OLED for a given drive signal. By measuring the changes in current at a given drive signal, the loss in efficiency can be inferred, and a correction can be applied to the driving signal to compensate for OLED aging. This correction is largely consistent with respect to variation in use and manufacture.