Performance comparison of perovskite solar cells with different architectures is nontrivial. J–V sweeps can be unreliable due to stack‐dependent output variations affected by sample preconditioning, scan rate, scan direction, and temperature. Maximum power point tracking is regarded as a more reliable performance measurement. In this study, a two‐step measuring procedure is proposed for quick and unbiased comparison of perovskite‐based solar cells. In the proposed procedure, the transient current density characterization step is used to determine optimal parameters for maximum power point tracking performance characterization. Moreover, factors affecting time limited maximum power point tracking by comparing performance and output of three different maximum power point tracking algorithms applied to devices, from three planar n‐i‐p perovskite stacks, are analyzed and identified. Numerical simulation is used to model differences and define limitations of the algorithms. As a result, it is shown that measurement delay and voltage step can have a crucial effect on maximum power point tracking output, regardless of the chosen algorithm.

Determining the accurate power output of perovskite‐based thin film solar cells is dependent on measuring conditions and parameters. In article no. http://doi.wiley.com/10.1002/solr.201800287, Lucija Rakocevic and co‐workers show how the choice of measuring parameters can alter the measured performance in maximum power point tracking. A measuring procedure for comparison of different perovskite‐based nip architectures is proposed.

No abstract