Abstract. The MATLAB™ toolbox MTEX provides a unique way to represent, analyse and interpret crystallographic preferred orientation, i.e. texture, based on integral ("pole figure") or individual orientation ("EBSD") measurements. In particular, MTEX comprises functions to import, analyse and visualize diffraction pole figure data as well as EBSD data, to estimate an orientation density function from either kind of data, to compute texture characteristics, to model orientation density functions in terms of model functions or Fourier coefficients, to simulate pole figure or EBSD data, to create publication ready plots, to write scripts for multiple use, and others. Thus MTEX is a versatile free and open-source software toolbox for texture analysis and modeling.

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This paper presents the background for the calculation of various numbers that can be used to characterize crystal-preferred orientation (CPO), also known as texture in materials science, for large datasets using the combined scripting possibilities of MTEX and MatLab w . The paper is focused on three aspects in particular: the strength of CPO represented by orientation and misorientation distribution functions (ODFs, MDFs) or pole figures (PFs); symmetry of PFs and components of ODFs; and elastic tensors. The traditional measurements of texture strength of ODFs, MDFs and PFs are integral measurements of the distribution squared. The M-index is a partial measure of the MDF as the difference between uniform and measured misorientation angles. In addition there other parameters based on eigen analysis, but there are restrictions on their use. Eigen analysis does provide some shape factors for the distributions. The maxima of an ODF provides information on the modes. MTEX provides an estimate of the lower bound uniform fraction of an ODF. Finally, we illustrate the decomposition of arbitrary elastic tensor into symmetry components as an example of components in anisotropic physical properties. Ten examples scripts and their output are provided in the appendix.

Highly concentrated distributed crystallographic orientation measurements within individual crystalline grains are analysed by means of ordinary statistics neglecting their spatial reference. Since crystallographic orientations are modelled as left cosets of a given subgroup of SO(3), the non‐spatial statistical analysis adapts ideas borrowed from the Bingham quaternion distribution on . Special emphasis is put on the mathematical definition and the numerical determination of a `mean orientation' characterizing the crystallographic grain as well as on distinguishing several types of symmetry of the orientation distribution with respect to the mean orientation, like spherical, prolate or oblate symmetry. Applications to simulated as well as to experimental data are presented. All computations have been done with the free and open‐source texture toolbox MTEX.

A method for reconstructing the three-dimensional grain structure from data collected with a recently introduced laboratory-based X-ray diffraction contrast tomography system is presented. Diffraction contrast patterns are recorded in Laue-focusing geometry. The diffraction geometry exposes shape information within recorded diffraction spots. In order to yield the three-dimensional crystallographic microstructure, diffraction spots are extracted and fed into a reconstruction scheme. The scheme successively traverses and refines solution space until a reasonable reconstruction is reached. This unique reconstruction approach produces results efficiently and fast for well suited samples.