Abstract:Surface science, which includes the preparation, development and analysis of surfaces and coatings, is essential in both fundamental and applied as well as in engineering and industrial research. Contact angle measurements using sessile drop techniques are commonly used to characterize coated surfaces or surface modifications. Well-defined surfaces structures at both nanoscopic and microscopic level can be achieved but the reliable characterization by means of contact angle measurements and their interpretation often remains an open question. Thus, we focused our research effort on one main problem of surface science community, which is the determination of correct and valid definitions and measurements of contact angles. In this regard, we developed the high-precision drop shape analysis (HPDSA), which involves a complex transformation of images from sessile drop experiments to Cartesian coordinates and opens up the possibility of a physically meaningful contact angle calculation. To fulfill the dire need for a reproducible contact angle determination/definition, we developed three easily adaptable statistical analyses procedures. In the following, the basic principles of HPDSA will be explained and applications of HPDSA will be illustrated. Thereby, the unique potential of this analysis approach will be illustrated by means of selected examples.

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Siloxane coatings for surfaces are essential in many scientific and industrial applications. We describe a straightforward gas-phase evaporation technique in inert atmosphere and introduce a practical and reliable silanization protocol adaptable to different silane types. The primary aim of depositing ultrathin siloxane films on surfaces is to enable a reproducible and homogenous surface functionalization without agglomeration effects during the layer formation. To realize high-quality and large-area coatings, it is fundamental to understand the reaction conditions of the silanes, the process of the siloxane layer formation, and the possible influence of the substrate morphology. We used three typical silane types to exemplify the potential and versatility of our process: aminopropyltriethoxysilane, glycidoxypropyltrimethoxysilane, and 1 H,1 H,2 H,2 H-perfluorooctyl-trichlorosilane. The ultrathin siloxane layers, which are generally difficult to characterize, were precisely investigated with high-resolution surface-characterization methods to verify our concept in terms of reproducibility and coating quality. Our results show that this gas-phase evaporation protocol is easily adaptable to all three, widely used silane types also enabling a large-area upscale.

Drop shape analysis is one of the most important and frequently used methods to characterise surfaces in the scientific and industrial communities. An especially large number of studies, which use contact angle measurements to analyse surfaces, are characterised by incorrect or misdirected conclusions such as the determination of surface energies from poorly performed contact angle determinations. In particular, the characterisation of surfaces, which leads to correlations between the contact angle and other effects, must be critically validated for some publications. A large number of works exist concerning the theoretical and thermodynamic aspects of two- and tri-phase boundaries. The linkage between theory and experiment is generally performed by an axisymmetric drop shape analysis, that is, simulations of the theoretical drop profiles by numerical integration onto a number of points of the drop meniscus (approximately 20). These methods work very well for axisymmetric profiles such as those obtained by pendant drop measurements, but in the case of a sessile drop onto real surfaces, additional unknown and misunderstood effects on the dependence of the surface must be considered. We present a special experimental and practical investigation as another way to transition from experiment to theory. This procedure was developed to be especially sensitive to small variations in the dependence of the dynamic contact angle on the surface; as a result, this procedure will allow the properties of the surface to be monitored with a higher precession and sensitivity. In this context, water drops onto a 111 silicon wafer are dynamically measured by video recording and by inclining the surface, which results in a sequence of non-axisymmetric drops. The drop profiles are analysed by commercial software and by the developed and presented high-precision drop shape analysis. In addition to the enhanced sensitivity for contact angle determination, this analysis technique, in combination with innovative fit algorithms and data presentations, can result in enhanced reproducibility and comparability of the contact angle measurements in terms of the material characterisation in a comprehensible way.

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