Typical optical metrology systems for surface and shape characterization are based on a separated camera and projection unit, yielding to a limitation concerning the miniaturization of the sensor. We present a compact, highly integrated optical distance sensor applying the inverse confocal principle using a bidirectional OLED microdisplay (BiMiD). This microdisplay combines light emitting device (AM-OLED microdisplay) and photo sensitive detectors (photodiode matrix) on one single chip based on OLED-on-CMOS-technology. Comparable to conventional confocal sensors, the object is shifted through the focal plane (±?z) and the back reflected/scattered light is collected via an special designed optic and detected by the photo sensitive detector elements. The detected photocurrent depends on movement (?z) of the measurement plane. In contrast to conventional confocal sensors, our inverse confocal sensor detects a minimum of reflected/scattered light if the object is positioned in the focal plane. We present a novel sensor concept as well as system and optical simulations that demonstrate the principle of the novel inverse confocal sensor setup

Small and compact optical system designs are needed in nearly all application scenarios of optical projection and imaging systems, e.g. automotive, metrology, medical or multimedia. Most active optical systems are based on separated imaging (e.g. camera unit) and image generating units (e.g. projection unit). This fact limits the geometrical miniaturization of the system. We present compact optical system designs using the new technology of bi-directional sensor devices. These devices combine light emitting and light detecting elements on one single chip. The application of such innovative opto-electronic devices -so-called bi-directional OLED microdisplays (BiMiDs) -offer a huge potential for miniaturization with a simultaneous increase of performance due to a new integration step. For these new bi-directional sensor devices new optical design concepts for simultaneous and sequential emission and detection are necessary. Because the simultaneous emission and detection can disturb the functionality of the optical system. New concepts has to be applied. A first concept is an exemplary 3-D metrology system applying fringe projection. A second concept is a pico-projection system with an integrated camera function. For both concepts the system configurations and the optical design are discussed. Due to the application of the bi-directional sensor device ultra-compact systems are presented.

Bidirectional OLED-based microdisplays offer interesting possibilities for new applications. Light emission and detection is combined on one single chip by using OLED on CMOS technology. Such a chip has primarily been developed for optocouplers or photo-electric barriers, but it offers interesting possibilities for other fields. A new optical concept of an inverse confocal sensor based on bidirectional OLED Display will be presented.

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