The present work demonstrates the production of single crystalline ZnO nanowires (NWs) using the low temperature hydrothermal process and their integration as the active channel material and piezoelectric elements in single NW field-effect transistors (FETs) and functional nanogenerators (NGs), respectively.Even though hydrothermally grown ZnO NWs show high levels of excess free carriers [10 18 cm À3 , we show that an optimized thermal annealing process at just 450 C in atmospheric air sufficiently reduces this level to around $3.7 Â 10 17 cm À3 . The excess free carrier suppression is verified by assessing the field-effect transport behaviour in a single NW FET. The single device is found to exhibit good performance metrics, including low off-state current (pA range), high on-state current (in the 10 s of mA range) and moderate effective mobility ($10 cm 2 V À1 s À1 ). The functional NGs are based on vertically grown ZnO NWs with $7 mm thick polydimethylsiloxane (PDMS) polymer matrix. We show that a NG incorporating annealed ZnO NWs can continuously generate higher output voltages and power compared to a reference device based on as-grown ZnO NWs. This included peak output voltage of $109 mV and an output power density of $16 mW cm À3 . We envisage that this approach of thermal annealing may find practical applications in other areas of hydrothermal ZnO NW research, including high performance NW FETs and piezoelectric energy harvesters.

The production of large quantities of single crystalline semiconducting ZnO nanowires (NWs) at low cost can offer practical solutions to realizing several novel electronic/optoelectronic and sensor applications on an industrial scale. The present work demonstrates high-density single crystalline NWs synthesized by a multiple cycle hydrothermal process at ∼100 °C. The high carrier concentration in such ZnO NWs is greatly suppressed by a simple low cost thermal annealing step in ambient air at ∼450 °C. Single ZnO NW FETs incorporating these modified NWs are characterized, revealing strong metal work function-dependent charge transport, unobtainable with as-grown hydrothermal ZnO NWs. Single ZnO NW FETs with Al as source and drain (s/d) contacts show excellent performance metrics, including low off-state currents (fA range), high on/off ratio (10(5)-10(7)), steep subthreshold slope (<600 mV/dec) and excellent field-effect carrier mobility (5-11 cm(2)/V-s). Modified ZnO NWs with platinum s/d contacts demonstrate excellent Schottky transport characteristics, markedly different from a reference ZnO NW device with Al contacts. This included abrupt reverse bias current-voltage saturation characteristics and positive temperature coefficient (∼0.18 eV to 0.13 eV). This work is envisaged to benefit many areas of hydrothermal ZnO NW research, such as NW FETs, piezoelectric energy recovery, piezotronics and Schottky diodes.

In this paper, we demonstrate the high electrical activity of extended defects found in 3C–SiC heteroepitaxially grown layer on (100) silicon substrates. Cross-sectional scanning transmission electron microscopy analysis was performed to reveal the defects while scanning spreading resistance microscopy aimed to study their electrical behavior. Using this technique, complete layer resistance cartography was done. The electrical activity of the extended defects in 3C–SiC was clearly evidenced. Furthermore, the defect activity was estimated to be higher than that of heavily nitrogen doped (5×1018 cm−3) 3C–SiC layer.