Around the time Maurice Hasler was building a spectrograph for use in his then-new Applied Research Laboratories in California, and about a year before Walter Baird started his namesake company just outside of Boston, Richard F. Jarrell was finishing up his four-year degree in Physics at the Massachusetts Institute of Technology. His father, J. O. Jarrell (who disliked and seldom used his given name, Joshua Oscar), had an established business in Boston selling microscopes and other optical goods. The elder Jarrell was taking on a new product line: spectrographs and other analytical instruments from London-based Adam Hilger Limited. He arranged for Dick, his oldest son, to spend the summer at Hilger learning firsthand as much as possible about their instrumentation. That trip, followed by a graduate fellowship project at MIT, set the stage for Jarrell's life in science and business-and for a spectroscopy company that still carries his name.

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In X-ray diffraction techniques intensity of radiation is an important factor. In addition, when high resolution is required, the usual collimating system restricts the width of focus that can be effectively used. Accordingly, a prime requirement is that the target loading shall be high to give the greatest possible brilliance at the focus. An X-ray unit designed to achieve these qualities will be described. Its use with a spectrometer and with a number of cameras for differing crystallographic studies will be illustrated.The tube operates with alternative electron guns, one of them to provide a circular focus of 40 microns in diameter and the other to provide a line focus of 1.4 millimeters in length and 0. 1 millimeter in width.

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