The class of dynamic faults has been recently shown to be an important class of faults for the new technologies of Random Access Memories (RAM) with significant impact on DPM levels. Very little research has been done in the design of memory test algorithms targeting dynamic faults. Two March test algorithms of complexity 11N and 22N, N is the number of memory cells, for subclasses of two-operation single-cell and two-cell dynamic faults respectively were proposed earlier by other authors. Also a March test of complexity 100N was proposed by them for detection of two-cell dynamic faults with two fault-sensitizing operations both applied on the victim or aggressor cells. In this paper, for the first time, minimal March test algorithms are proposed for two-operation singlecell and two-cell dynamic faults. The previously known March test algorithm for detection of two-operation two-cell dynamic faults is improved by 30N.

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Previously, a minimal algorithm of length 70N, N is the number of memory bits, was proposed for a subclass of dynamic faults. In this paper, a March-based fault location and full diagnosis algorithm of complexity 88N+29 is proposed for the same subclass of dynamic faults in bit-oriented SRAMs.

A March-based fault location algorithm of minimum length is proposed for bit-oriented Static RAMs. A minimal March algorithm of complexity 18N, N is the number of memory words (bits), is defined in Phase 1 for detection of all unlinked static faults and partial diagnosis. March-like algorithms of complexity N+O(1) are proposed in Phase 2 to split the groups of faults with the same syndrome defined after Phase 1 into smaller subgroups. March-like algorithms of complexity 2N to 5N are used in Phase 3 for location of the aggressor bits of coupling faults (CF). The proposed minimal algorithm has 100% fault location ability with the least time complexity in Static RAMs.