This work demonstrates terahertz (THz) line imaging that acquires broadband spectral information by combining echelon-based single-shot THz spectroscopy with high-sensitivity phase-offset electrooptic detection. An approximately 40 dB signal-to-noise ratio is obtained for a THz spectrum from a single line of the camera, with a detection bandwidth up to 2 THz at the peak electric-field strength of 1.2 kV/cm. The spatial resolution of the image is confirmed to be diffraction limited for each spectral component of the THz wave. We use the system to image sugar tablets by quickly scanning the sample, which illustrates the capacity of the proposed spectral line imaging system for high-throughput applications.

Determining the dynamics of electrons and ions emitted from a target material during laser ablation is crucial for desirable control of laser processing. However, these dynamics are still challenging to understand because of a lack of ubiquitous spectroscopic tools to observe tangled-up dynamics appearing at ultrafast timescales. Here by harnessing highly sensitive single-shot terahertz time-domain spectroscopy using an echelon mirror, we investigate pulse-to-pulse temporal profile of terahertz radiation generated from the material surface. We clearly found that the carrier–envelope phase and the electric field amplitude of the terahertz waveform systematically vary between the pre- and post-ablation depending on the laser fluence and irradiated pulse numbers. Our results provide a stepping-stone towards perception of Coulomb explosion occurring throughout the laser ablation process, which is indispensable for future laser processing applications.

Initial charge emission dynamics during femtosecond laser ablation was visualized by detecting the terahertz radiation waveform using a highly sensitive single-shot terahertz spectrometer. Pulse-to-pulse changes of the terahertz waveforms were clearly observed.

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