In relational event networks, the tendency for actors to interact with each other depends greatly on the past interactions between the actors in a social network. Both the volume of past interactions and the time that has elapsed since the past interactions affect the actors’ decision-making to interact with other actors in the network. Recently occurred events may have a stronger influence on current interaction behavior than past events that occurred a long time ago–a phenomenon known as “memory decay”. Previous studies either predefined a short-run and long-run memory or fixed a parametric exponential memory decay using a predefined half-life period. In real-life relational event networks, however, it is generally unknown how the influence of past events fades as time goes by. For this reason, it is not recommendable to fix memory decay in an ad-hoc manner, but instead we should learn the shape of memory decay from the observed data. In this paper, a novel semi-parametric approach based on Bayesian Model Averaging is proposed for learning the shape of the memory decay without requiring any parametric assumptions. The method is applied to relational event history data among socio-political actors in India and a comparison with other relational event models based on predefined memory decays is provided.

In relational event networks, endogenous statistics are used to summarize the past activity between actors. Typically, it is assumed that past events have equal weight on the social interaction rate in the (near) future regardless of the time that has transpired since observing them. Generally, it is unrealistic to assume that recently past events affect the current event rate to an equal degree as long-past events. Alternatively one may consider using a prespecified decay function with a prespecified rate of decay. A problem then is that the chosen decay function could be misspecified yielding biased results and incorrect conclusions. In this paper, we introduce three parametric weight decay functions (exponential, linear, and one-step) that can be embedded in a relational event model. A statistical method is presented to decide which memory decay function and memory parameter best fit the observed sequence of events. We present simulation studies that show the presence of bias in the estimates of effects of the statistics whenever the decay, as well as the memory parameter, are not properly estimated, and the ability to test different memory models against each other using the Bayes factor. Finally, we apply the methodology to two empirical case studies.

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