SummaryFrequency modulated Kelvin probe force microscopy (FM-KFM) is the method of choice for high resolution measurements of local surface potentials, yet on coarse topographic structures most researchers revert to amplitude modulated lift-mode techniques for better stability. This approach inevitably translates into lower lateral resolution and pronounced capacitive averaging of the locally measured contact potential difference. Furthermore, local changes in the strength of the electrostatic interaction between tip and surface easily lead to topography crosstalk seen in the surface potential. To take full advantage of the superior resolution of FM-KFM while maintaining robust topography feedback and minimal crosstalk, we introduce a novel FM-KFM controller based on a Kalman filter and direct demodulation of sidebands. We discuss the origin of sidebands in FM-KFM irrespective of the cantilever quality factor and how direct sideband demodulation enables robust amplitude modulated topography feedback. Finally, we demonstrate our single-scan FM-KFM technique on an active nanoelectronic device consisting of a 70 nm diameter InAs nanowire contacted by a pair of 120 nm thick electrodes.

The acid-assisted wet-chemical and the adhesive-tape induced micromechanical exfoliation of differently sized single crystals of a 2D polymer (approx. 20 μm and 100 μm) is shown to result in thin sheet stacks. Tuning of the thickness is achieved via duration and frequency of the exfoliation, respectively. A color code is established that correlates interference colors of sheet stacks on SiO(300 nm)/Si as observed under an optical microscope with their thicknesses measured by atomic force microscopy. This facilitates reliable monitoring of the exfoliation and quick identification of sheet stacks of a desired thickness. Furthermore, high resolution atomic force microscopy is applied to investigate the surfaces of starting crystals and both wet-chemically and micromechanically exfoliated sheet stacks aiming at exploring whether exfoliation proceeds with preservation of surface periodicity and with a low frequency of sheet rupturing. These investigations also aimed at uncovering possible point defects and domain (grain) boundaries in the surfaces. It appears that all investigated objects have a high molecular scale perfection and that both exfoliation methods proceed mild enough to largely preserve the molecular structure of the 2D polymer including the not covalently bonded template molecules being part of the crystal packing.

Self-assembled stabilized nanoporous C60 films offer an enhanced active interfacial area.

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SummaryFrequency-modulation atomic force microscopy has turned into a well-established method to obtain atomic resolution on flat surfaces, but is often limited to ultra-high vacuum conditions and cryogenic temperatures. Measurements under ambient conditions are influenced by variations of the dew point and thin water layers present on practically every surface, complicating stable imaging with high resolution. We demonstrate high-resolution imaging in air using a length-extension resonator operating at small amplitudes. An additional slow feedback compensates for changes in the free resonance frequency, allowing stable imaging over a long period of time with changing environmental conditions.