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There remain significant gaps in our ability to predict dewetting and wetting despite the extensive study over the past century. An important reason is the absence of nanoscopic knowledge about the processes near the moving contact line. This experimental study for the first time obtained the liquid morphology within 10 nm of the contact line, which was receding at low speed (U < 50 nm/s). The results put an end to long-standing debate about the microscopic contact angle, which turned out to be varying with the speed as opposed to the constant-angle assumption that has been frequently employed in modeling. Moreover, a residual film of nanometer thickness ubiquitously remained on the solid after the receding contact line passed. This microscopic residual film modified the solid surface and thus made dewetting far from a simple reverse of wetting. A complete scenario for dewetting and coating is provided.