WSe2 is a member of groupVI Transition Metal Dichalcogenides (TMDCs) and has been observed to be a highly stable semiconducting material. It has been grown in crystal form using a direct vapour transport technique in present case. The grown WSe2 crystals were characterized for the structural properties using X-ray diffraction technique (XRD). The hexagonal structure was confirmed through this analysis. Using the data of XRD, various parameters like crystalline size, lattice parameters, micro strain, dislocation density, unit cell volume, unit cell density, growth fault and deformation fault probability etc were found. It was seen that the micro strain, dislocation density and growth & deformation fault probabilities were found to be very low in WSe2 crystals. The grown WSe2 crystals were characterized for optical properties using UV-VIS-NIR spectroscopy. The absorption spectra of WSe2 grown in present case revealed the fact that WSe2 posses direct band gap around 1.38eV. Layered di-chalcogenides WSe2 (or MoSe2) are used for desired applications such as in photo-conversion devices.

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.

The optical characterization of Molybdenum diselenide (MoSe2) and polyaniline (PANI) has been carried in the wavelength range 200 nm to 2500 nm. The detailed analysis of the optical properties has been carried out only for a range 200 nm to 800 nm from which the indirect band gap around 1.42 eV for MoSe2and 1 eV and 2.5 eV for PANI was evaluated. It was interesting to note that π π* transitions lead to two distinct orders of energy gaps. The hybrid cells were fabricated using a photosensitive interface between MoSe2and PANI. Various parameters of these heterostructure hybrid cells have been evaluated and it was found that the photoconversion efficiency was around 1%. Using the solar cell characteristics, the presence of trapping centers at the n-MoSe2/ p-PANI interface has been confirmed.

MoS possesses a band gap around 1.4 eV which is nearly to maxima of solar radiations. The investigations on this kind MoSbased photovoltaic cells having the rectifying interface with polypyrrole. It was observed that MoS/polypyrrole structure exhibits a photovoltaic behaviour. The photoconversion efficiency and fill factor of above cell is calculated, the maximum photoconversion efficiency is 0.089 and fill factor is 0.5.

Physical vapour technique (PVT) is a versatile method to grow IIVI semiconductors. In present investigations, CdS crystals have been grown by this method using dual zone micro processor controlled horizontal furnace. CdS crystals grown in present case have been characterized by EDAX for stoichiometric conformation. The roughness of surface of grown CdS crystals has been studied in detail using optical microscopy, SEM and AFM. The surface topography study of as grown crystals has been carried out to understand the growth mechanism which was necessary for its application in electronic devices.