We report on the electrical characterization of single-crystal ZnO and Au Schottky contacts formed thereon before and after bombarding them with 1.8 MeV protons. From capacitance–voltage measurements, we found that ZnO is remarkably resistant to high-energy proton bombardment and that each incident proton removes about two orders of magnitude less carriers than in GaN. Deep level transient spectroscopy indicates a similar effect: the two electron traps detected are introduced in extremely low rates. One possible interpretation of these results is that the primary radiation-induced defects in ZnO may be unstable at room temperature and anneal out without leaving harmful defects that are responsible for carrier compensation.
We report on the electrical and defect characterization of Au Schottky diodes formed on single-crystal ZnO, before and after irradiating with high-energy (1.8 MeV) protons. Prior to bombardment we observed that several electron traps (E1-E4), with energies between 0.10 and 0.57 eV below the conduction band, are present in the ZnO. High-energy proton bombardment introduces two electron traps (Ep1 and Ep2), with extremely low introduction rates (η) of 2.4 and 1.9 cm −1 , respectively. Schottky barrier properties such as the reverse leakage current deteriorated from 1 × 10 −9 A for an unirradiated diode to 1 × 10 −6 A after bombarding it with a dose of 4.2 × 10 14 cm −2 protons. Compared to GaN we found that ZnO is remarkably resistant to high-energy proton bombardment.
Terahertz transient conductivity measurements are performed on pentacene single crystals, which directly demonstrate a strong coupling of charge carriers to low frequency molecular motions with energies centered around 1.1 THz. We present evidence that the strong coupling to low frequency motions is the factor limiting the conductivity in these organic semiconductors. Our observations explain the apparent paradox of the "bandlike" temperature dependence of the conductivity beyond the validity limit of the band model. © 2008 American Institute of Physics. ͓DOI: 10.1063/1.2955462͔Recent years have seen much interest in the conductivity of pentacene and other molecular semiconductors of the oligoacene family, fueled by the unique properties of these materials. Oligoacenes are flexible, cheap, and exhibit relatively high charge carrier mobilities, 1 allowing for novel applications in electronic devices. [2][3][4] Despite this interest, the nature of charge transport in the materials has remained the subject of intense debate.Crystalline organic semiconductors exhibit charge mobilities that decrease with temperature. [5][6][7][8][9] In analogy to inorganic semiconductors, this has been interpreted as an indication of delocalized charge carriers and a "bandlike" transport mechanism. 10-13 Theoretical models based on polaronic band conduction 14 indeed provide a good qualitative description of the bandlike mobility of charge carriers in pentacene, but the factors determining the absolute charge mobility remain unknown. For instance, an analysis of the high temperature mobility has indicated that the mean free path of charge carriers is of the same magnitude as the intermolecular distance. 15 It is not clear as to why the signature of delocalized bandlike transport persists at these temperatures, where the mean free path is smaller than the intermolecular distances. Because of the "softness" of these van der Waals bonded organic crystals, it is possible that the coupling of the carriers with the intermolecular vibrations could play a key role in the description of the charge carrier dynamics. Troisi and Orlandi 16 have recently formulated a model ͑TO model͒ that states that the charge mobility in oligoacenes is limited by large fluctuations of the electronic coupling between adjacent organic molecules due to thermal molecular motions, in particular, the low energetic phonon modes with energies around 1 THz. 17 This model correctly describes the bandlike temperature dependence of the mobility, including its absolute value, outside the validity of delocalized transport models. 16 Direct experimental evidence for the various proposed models has been lacking. In particular, experimental insights into the role of intermolecular low frequency vibrational modes in determining the charge transport mechanism have been missing to date.Terahertz spectroscopy 18 provides the opportunity of studying the response of charge carriers in the frequency range of these modes, and has proven useful for investigating photocarrier dynamics in...
We determine the ultrafast frequency-and time-resolved complex dielectric responses of photoexcited, single-crystal rubrene in the frequency range of 10-30 THz ͑330-1000 cm −1 ͒ using ultrafast broadband THz spectroscopy. In this frequency range, we observe the response of both photogenerated mobile charges and intramolecular vibrational modes simultaneously, both of which vary with time after excitation. The data in conjunction with a theoretical model indicate a dynamic blueshift of the 15.5 THz phonon.
We have studied defects introduced in n-GaN during 25 keV hydrogen and 40 keV He implantation using deep level transient spectroscopy (DLTS). These measurements revealed that 25 keV hydrogen implantation introduces a complex set of electron traps, of which most are different to the defects observed after high-energy (MeV) electron and proton implantation. At least three of the defects detected after 25 keV proton implantation exhibit a metastable character in that they can be reproducibly removed and re-introduced during reverse and zero bias anneal cycles. Isochronal and isothermal annealing experiments yielded low activation energies of approximately 0.1 -0.2 eV for both processes. By comparison, 40 keV He ion implantation introduced the same metastable defects, but in different relative concentrations.
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