This letter illustrates the transport phenomena associated with single-walled carbon nanotube (SWNT) junctions of Y- and cross-configurations. Localized gating effect exhibited by Y- and crossed-junctions suggests the resemblance of their electrical characteristics with ambipolar and unipolar p-type FETs, respectively. Temperature dependence of the I-V characteristics reveals that the conduction mechanism in the said SWNT junctions is governed by thermionic emission at temperatures above 100 K and by tunneling at T < 100 K. In-depth analysis of current transport through the crossed- and Y-junction SWNTs is significant in view of their predominant influence on the electrical performance of carbon nanotube networks (CNT-mat).

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There has been growing interest and rapid development in transparent electrode films, which are flexible and light and used in mobile, simple information, and electronic devices, and based on recent advancements in nano technology, information technology, and display technology. In particular, studies on developing such films with both high conductivity and high transmittance of visible rays are highly in demand for commercialization. In this study, transparent electrode films were developed for IT using micro patterns that show sheet resistance less than 10 Ω/□, adhesive strength more than 98%, and light transmittance more than 90%. The results of applying a surface emission gradient minimization (Honey Comb) technology to the films was the verification of the sheet resistance, adhesive strength, and light transmittance satisfying the target level of this study through Imprinting and Remolding processes.