By the end of 2018, 42 years after the landing of the two Viking seismometers on Mars, InSight will deploy onto Mars’ surface the SEIS ( S eismic E xperiment for I nternal S tructure) instrument; a six-axes seismometer equipped with both a long-period three-axes Very Broad Band (VBB) instrument and a three-axes short-period (SP) instrument. These six sensors will cover a broad range of the seismic bandwidth, from 0.01 Hz to 50 Hz, with possible extension to longer periods. Data will be transmitted in the form of three continuous VBB components at 2 sample per second (sps), an estimation of the short period energy content from the SP at 1 sps and a continuous compound VBB/SP vertical axis at 10 sps. The continuous streams will be augmented by requested event data with sample rates from 20 to 100 sps. SEIS will improve upon the existing resolution of Viking’s Mars seismic monitoring by a factor of at 1 Hz and at 0.1 Hz. An additional major improvement is that, contrary to Viking, the seismometers will be deployed via a robotic arm directly onto Mars’ surface and will be protected against temperature and wind by highly efficient thermal and wind shielding. Based on existing knowledge of Mars, it is reasonable to infer a moment magnitude detection threshold of at epicentral distance and a potential to detect several tens of quakes and about five impacts per year. In this paper, we first describe the science goals of the experiment and the rationale used to define its requirements. We then provide a detailed description of the hardware, from the sensors to the deployment system and associated performance, including transfer functions of the seismic sensors and temperature sensors. We conclude by describing the experiment ground segment, including data processing services, outreach and education networks and provide a description of the format to be used for future data distribution. Electronic Supplementary Material The online version of this article (10.1007/s11214-018-0574-6) contains supplementary material, which is available to authorized users.
This paper reviews the research and development of micromachined accelerometers with a noise floor lower than 1 µg/√Hz. Firstly, the basic working principle of micromachined accelerometers is introduced. Then, different methods of reducing the noise floor of micromachined accelerometers are analyzed. Different types of micromachined accelerometers with a noise floor below 1 µg/√Hz are discussed. Such sensors can mainly be categorized into: (i) micromachined accelerometers with a low spring constant; (ii) with a large proof mass; (iii) with a high quality factor; (iv) with a low noise interface circuit; (v) with sensing schemes leading to a high scale factor. Finally, the characteristics of various micromachined accelerometers and their trends are discussed and investigated.
We demonstrate a microseismometer with a 2ng/rtHz noise floor capable of autonomous operation over a wide range of tilts. This represents the highest performance yet achieved by a silicon-based vibration sensor. The microseismometer builds on previous development of a shortperiod seismometer for NASA's 2016 InSight mission to Mars . The deep-reactive-ion-etched sensor element is unique in that it uses a spring-mass system with a proof mass that moves laterally. This minimizes the damping of the spring mass systems without the need for vacuum encapsulation. The proof-mass position is sensed by a periodic linear capacitive array transducer allowing highly sensitive position detection combined with feedback control at multiple null points. Operation at any of these points enables the sensor to function over a large tilt range without compromising the noise performance. As well as the capacitive sensing elements, the proof mass has planar coils on the surface to electromagnetic actuator when placed in a static magnetic field. The MEMS sensor element is connected to an electronics feedback circuit similar to those used in broad-band seismometers allowing the sensor to act as a velocity output force balance transducer.
Microelectromechanical tunneling sensor fabrication and post-processing characterization using focused ion beams J.
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