The act of searching for security aws (vulnerabilities) in a piece of software was previously considered to be the preserve of malicious actors, or at least actors who wished to cause chaos. Increasingly, however, companies are recognising the value of running a bug bounty program, where they will pay 'white hat' hackers to locate and disclose security aws in their applications in order that they can x it. This is known as a 'bug bounty' or a 'vulnerability reward program', and at present has seen comparatively little research. This paper introduces two existing research on bug bounties in two areas: as a means of regulating the sale of vulnerabilities; and as a form of crowdsourcing. We argue that the nature of bug bounties makes Web science particularly suitable to drive forward research. We identify gaps in the current literature, and propose areas which we consider to be particularly promising for future research. CCS Concepts: • Information systems → Crowdsourcing; • Security and privacy → Social aspects of security and privacy;

Distributed Ledgers (DLs), also known as blockchains, provide decentralised, tamper-free registries of transactions among partners that distrust each other. For the scientific community, DLs have been proposed to decentralise and make more transparent each step of the scientific workflow. For the particular case of dissemination and peerreviewing, DLs can provide the cornerstone to realise open decentralised publishing systems where social interactions between peers are tamperfree, enabling trustworthy computation of bibliometrics. In this paper, we propose the use of DL-backed smart contracts to track a subset of social interactions for scholarly publications in a decentralised and reliable way, yielding Smart Papers. We show how our Smart Papers approach complements current models for decentralised publishing, and analyse cost implications.

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The application of Optical Proximity Correction for improving uniformity of printed dimensions at sub-hall-micron resolution in a 0.35 micron CMOS process is described. Results are presented in terms of measurements made on polysilicon gates, at different pitches, which are compared to the uncorrected case. The impact of photomask and stepper lens qualities on dimensional control are also considered. Results presented are at the demonstrator stage but strategy for implementation in production is discussed.