A ray-driven backprojector is based on ray-tracing, which computes the length of the intersection between the ray paths and each voxel to be reconstructed. To reduce the computational burden caused by these exhaustive intersection tests, we propose a fully graphics processing unit (GPU)-based ray-driven backprojector in conjunction with a ray-culling scheme that enables straightforward parallelization without compromising the high computing performance of a GPU. The purpose of the ray-culling scheme is to reduce the number of ray-voxel intersection tests by excluding rays irrelevant to a specific voxel computation. This rejection step is based on an axis-aligned bounding box (AABB) enclosing a region of voxel projection, where eight vertices of each voxel are projected onto the detector plane. The range of the rectangular-shaped AABB is determined by min/max operations on the coordinates in the region. Using the indices of pixels inside the AABB, the rays passing through the voxel can be identified and the voxel is weighted as the length of intersection between the voxel and the ray. This procedure makes it possible to reflect voxel-level parallelization, allowing an independent calculation at each voxel, which is feasible for a GPU implementation. To eliminate redundant calculations during ray-culling, a shared-memory optimization is applied to exploit the GPU memory hierarchy. In experimental results using real measurement data with phantoms, the proposed GPU-based ray-culling scheme reconstructed a volume of resolution 28032803176 in 77 seconds from 680 projections of resolution 10243768 , which is 26 times and 7.5 times faster than standard CPU-based and GPU-based ray-driven backprojectors, respectively. Qualitative and quantitative analyses showed that the ray-driven backprojector provides high-quality reconstruction images when compared with those generated by the Feldkamp-Davis-Kress algorithm using a pixel-driven backprojector, with an average of 2.5 times higher contrast-to-noise ratio, 1.04 times higher universal quality index, and 1.39 times higher normalized mutual information.

No abstract

Application of electric current pulses during plastic deformation changes the mechanical behavior owing to the electro-plastic effect. The effect of electric current pulses on the Al5052 alloy is investigated in this study. In order to demonstrate the advantages of passing electric current pulses through a metal sheet during the forming process, a uniaxial tensile test with an electric current pulse was carried out using a self-designed device; this device can apply a 2-kA electric current pulse to the specimen for a short period (>100ms). The electric current increases the temperature of the specimen due to Joule heating. It is, therefore, necessary to decouple the thermal effect from the overall behavior to understand only the contribution of electric current in the mechanical behavior. Firstly, an electro-thermo-mechanical finite element study of an electrically assisted uniaxial tensile test of Al5052 alloy is performed to isolate the thermal effect. The simulated results yielded the thermal effect due to the electric current. By comparing the experimental and simulated results, the contribution of electric current is decoupled from that of thermal effect. The electric current-dependent material model is implemented into the commercial FEM code LS-DYNA using user-defined material(UMAT) subroutine. The electric current-dependent material model was used to simulate the electro-mechanical finite element analysis of the high-speed forming of an aluminum sheet with electric current pulse. Simulation results were compared with experimental results at several applied electric currents to evaluate the accuracy of the UMAT. The present work can be utilized to develop simpler constitutive models for the mechanical behavior of metals subjected to a pulsed electric current.

No abstract

No abstract