The paper is focused on the preparation and surface characterization of gold coatings and nanostructures deposited on glass substrate. Different approaches for the layer preparation were applied. The gold was deposited on the glass with (i) room temperature, (ii) glass heated to 300°C, and (iii) the room temperature-deposited glass which was consequently annealed to 300°C. The sheet resistance and concentration of free carriers were determined by the van der Pauw method. Surface morphology was characterized using an atomic force microscopy. The optical properties of gold nanostructures were measured by UV–vis spectroscopy. The evaporation technique combined with simultaneous heating of the glass leads to change of the sheet resistance, surface roughness, and optical properties of gold nanostructures. The electrically continuous layers are formed for significantly higher thickness (18 nm), if the substrate is heated during evaporation process. The annealing process influences both the structure and optical properties of gold nanostructures. The elevated temperature of glass during evaporation amplifies the peak of plasmon resonance in the structures, the surface morphology being significantly altered.
The paper reviews the problems of measurement of sheet resistance of ultrathin high-resistance layers of organic semiconductors and the essential underlying problems. Particular attention is paid to potential influence of the resistance of contact regions on the results of direct measurement of sheet resistance of stripe-shaped layers. In this connection, we present a methodology of double length stripe resistance measurement (DLSRM), used above all to minimise the influence of contact regions on the measurement results. We deduce theoretical as well as practical possibilities of DLSRM in the diagnostics and quantitative characterisation of unsuitable or even faulty contacts on high-resistance layers. The application efficiency of the DLSRM method is documented by the results of sheet resistance measurement on zinc phthalocyanine with cathode sputtered planar contacts of noble metals (gold, platinum, or palladium). As expected, gold is the best contact material, but even in its application one cannot neglect the influence of contact regions. The presented method is universal and generally applicable to all materials where sheet resistance is the relevant parameter, and its assessment is based on measurements of the layer resistance in stripe arrangement.
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