X-ray digital micro-tomography was employed for precise strain measurement which is essential for evaluation of the experiments with small samples of trabecular bone. X-ray Digital Volumetric Correlation (DVC) method was used to identify the three-dimensional strain field in loaded complex microstructure. DVC relies on tracking selected sample points within the threedimensional image data throughout the sequence of captured projections. In this study an improved DVC method is applied for evaluation of the strain field in trabecular bone sample subjected to compressive loading. The deformed sample was tomographically scanned using micro-focus X-ray tube and the single-photon counting silicon pixel detector Medipix2.

Time-lapse X-ray computed microtomography was employed to quantify the deformation behaviour of closed-cell aluminium foam. The specimen was incrementally loaded and tomographically scanned using a custom X-ray tomographic device to capture the deforming microstructure. Because of the very small thickness of the cell walls and the high ratio between pore size and cell wall thickness cone-beam reconstruction procedure was applied. A finite element (FE) model was developed based on the reconstructed three-dimensional data. The FE model was used for two purposes: i) the nodal points were used for tracking the displacements of the deforming structure, ii) verification of the material model for description of the foam's deformational behaviour. Digital volumetric correlation (DVC) algorithm was used on data obtained from the time-lapse tomography to provide a detailed description of the evolution of deformation in the complex structure of aluminium foam. The results from DVC demonstrate the possibility to use the complex microstructure of the aluminium foam as a random pattern for the correlation algorithm. The underlying FE model enables easy comparison between experimental results and results obtained from numerical simulations used for evaluation of proposed constitutive models. KEYWORDS: Computerized Tomography (CT) and Computed Radiography (CR); Pixelated detectors and associated VLSI electronics; X-ray radiography and digital radiography (DR)