A simple method for the determination of the absorption correction for intermediate samples is presented. This method consists in measurements of the intensity of radiation of an analyte element in two samples with different masses per unit area and with identical composition. The absorption correction can be determined for samples loaded on the thin or thick substrate or without substrate in the same way. The results obtained are compared with those given by an emission–transmission method with the use, as an example, of synthetic samples pressed into pellets. The absorption correction was also determined for geological samples collected on a filter mounted on a thick substrate. A simple apparatus for collecting powder material on the filter is presented. Copyright © 2003 John Wiley & Sons, Ltd.

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A simple and quick method of durable samples preparation by the thin layer method through direct digesting of the analysed material on the substrate has been presented. Four-and three-component mono-and polycrystals have been analysed. Standards have been used in calibration containing: Cr, Co, Ni, Cu, Zn, Ga, Se, Sb, Yb. To improve the correlation between the concentration and the¯uorescent radiation models of mathematical corrections have additionally been used: multiple linear regression, Lucas-ToothPyne model (L. T. P.) and de Jongh model (d. J.).Statistical parameters: detection limits for 0.5 mg samples: Cr±0.041%, Co±0.034%, Ni±0.042%, Cu± 0.053%, Zn±0.054%, Ga±0.057%, Se±0.057%, Sb± 0.113%, Yb±0.077%. Correlation coef®cients: simple regression 0.9946±0.9997, multiple regression 0.9974±1.0000, L. T. P. 0.9993±1.0000, d. J. 0.9995± 1.0000.

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