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A new inner tracking detector for the Phase-II upgrade of the ATLAS experiment is in development. A serial power scheme is foreseen for the pixel detector. This requires a new detector control system to monitor and control the pixel modules in the serial power chain. The Pixel Serial Power Protection (PSPP) chip is an ASIC for this purpose. It operates parallel to the modules and contains an ADC and bypass transistor. This paper presents test results for the prototyped PSPP chip. It includes irradiation up to 600 Mrad total ionizing dose and long-term measurements. The third version of the PSPP chip is functional and will be used for tests with serial power chains together with pixel modules.

The present interest among microscopists in digital image acquisition and analysis is surveyed and a trend towards using smaller computers identified. X‐ray images in particular are discussed. A simple arrangement for linking a Scanning Electron Microscope (SEM) based Energy Dispersive Spectroscopy (EDS) unit to an IBM Personal Computer (IBM‐PC) is described in detail. While readily available technical information is omitted, complete circuit diagrams and software flowcharts are given to facilitate reproduction of the system. Annotated listings of the programs used are available from the authors. Examples concerned with topographic effects in x‐ray maps illustrate the use of the system.