Skid resistance, on which road safety depends, is closely related to the road surface texture and particularly to its microtexture. The microtexture is defined as surface irregularities whose height ranges from 0.001 mm to 0.5 mm and whose width is less than 0.5 mm (Alvarez and Mprel, 1994). The deterioration due to the road traffic, especially polishing effect, involves a change in the microtexture. So, we suggest a method to characterize, through image analysis, wear level or microroughness of road surfaces. We propose then, on one hand a photometric model for road surface, and, on the other hand, a geometrical model for road surface profile. These two models allow us to develop roughness criteria based on the study of the statistical properties of: the distribution of the gray levels in the image, the distribution of the absolute value of its gradient, the form of its autocorrelation function, and the distribution of its curvature map. Experiments have been done with images of laboratory-made road specimens at different wear levels. The obtained results are similar to those obtained by a direct method using road profiles.
In this study, we propose an original method for a 3D reconstruction of the relief of a textured rough surfaces. This 3D reconstruction is obtained through the elaboration of a photometric model, which takes into account camera and light source positions according to the plan of the rough surface. The proposed model expresses the gray level on the image according to the local relief variations. Three images of the same relief obtained under different angles of lighting are used to reconstruct the altitude map of the rough surface. The effectiveness of this method was checked by comparing the extracted relief to its corresponding relief obtained from a mechanical device method using autofocus laser sensor. This photometric model display good results in simulation experience and will be applied on real photographic images of road covering surface in order to study its wear level and its adherence.
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