This study examines zirconium electrochemical redox behaviors in LiCl-KCl-ZrCl 4 at 500 • C. Cyclic voltammetries are conducted with tungsten working and counter electrode. Four oxidation peaks and three reduction peaks are observed and redox reactions which could contribute to each peak are determined based on electrolysis results and peak height changes of cyclic voltammogram according to scan rates and ranges. Zr(IV) could be reduced into ZrCl when cathode potential is more negative than −1.1 V (vs. 1 wt% Ag/AgCl) and ZrCl would be reduced into Zr metal if cathode potential become more negative than −1.2 V. ZrCl and Zr metal could be oxidized into mainly Zr(IV) in LiCl-KCl-ZrCl 4 (1 wt%). Zr(II) could exist in the molten salt but the concentration might be small because heights of cyclic voltammogram peaks related to redox reactions of Zr(II) are relatively small. Based on cyclic voltammetry results, suggestions for the electrorefining of irradiated Zircaloy-4 cladding are proposed. High cathodic current density is preferred to recover zirconium as a metal state and low anodic current density is required to prevent dissolution of elements which are more reductive than zirconium.
In this paper, we have proposed, fabricated and characterized piezoelectrically actuated RF MEMS (radio-frequency micro-electro-mechanical system) switches. They have been designed to operate at a low operation voltage for advanced mobile/wireless handset applications. The proposed switches are largely composed of piezoelectric cantilever actuators with an Au contact electrode and CPW (coplanar wave) transmission lines suspended over the substrate. Two different types of RF MEMS switches have been suggested to find the better geometry. One has the structure of one single piezoelectric cantilever and a contact electrode attached to its edge with three hinges (type-A), and the other contains four piezoelectric cantilevers that are symmetrically combined through each hinge to support a centered contact electrode (type-B). The two different fabricated (type-A and type-B) RF MEMS switches have insertion losses of −0.22 and −0.23 dB at an operation voltage of 2.5 V and a frequency of 2 GHz, respectively. Although the difference in insertion loss is trivial, there exist different dependences of insertion loss on applied voltage between them. The insertion losses of type-A switches are changed with varying operation voltage because the touching area between the contact electrode and the signal transmission lines is variable. Meanwhile, the type-B switches show nearly constant insertion losses regardless of operation voltage. The type-A and type-B switches have isolation values of −40.8 and −42.5 dB at a frequency of 2 GHz, respectively.
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