The paper introduces a method for studying flow dynamics using diffractive optical element based background-oriented schlieren (BOS). Our method relies on fringe demodulation using root multiple signal classification technique which provides high robustness against noise. Further, a graphics processing unit (GPU) based implementation is proposed which offers significant improvement in computational efficiency, and thus enables high speed analysis of flows. The performance of the method is demonstrated via numerical simulations and the practical applicability is also shown by analyzing a diffusion phenomenon in liquids by BOS.
Dynamic measurement of surface profile is an important requirement in nondestructive testing, especially for the inspection of large samples with consecutive area scans or test objects under translation. In this paper, we propose the application of an eigenspace signal analysis method in diffraction phase microscopy for reliable and noncontact dynamic surface metrology. We also propose the inclusion of a graphics processing unit (GPU) computing framework in our method to enable fast interferogram processing for dynamics-based investigations. The practical viability of the proposed method is demonstrated for noninvasive nanoscale topography of a test target.
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