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The glass system SiOz-A1z03-LizO-Ti02 was examined to determine the dependence of hardness on heat-treatment temperature. In addition to hardness measurements, X-ray diffraction (XRD) was used to determine the type and amount of phases present and to relate this to the hardness results. Hardness increased with heat-treatment temperature. This correlated with the amounts of crystals present, as determined by XRD. For a particular heat-treatment temperature, when hardness was plotted versus load on the indenter, there was a load dependence. There was at first a rapid decrease as the load on the indenter increased, with a constant value being approached at higher loads. [

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