The absolute efficiency of a phosphor screen is the ratio of the light energy per unit area at the screen surface to the incident x-ray energy fluence. Particle size is a critical factor in determining the absolute efficiency, but in most models its influence is not accounted for. To allow derivation of the particle size dependence, a model is proposed that describes the optical properties of the screen by means of a single parameter, the light extinction factor, xi, and assumes that the intrinsic efficiency (light energy/energy imparted to the phosphor material) is independent of particle size. The value of xi depends on the type of screen (phosphor, reflective backing, coating and binder) and has to be determined from measurements on at least two screens with known particle size and thickness. The absolute efficiency can then be calculated for an extended range of particle sizes and/or screen thicknesses. To test the model, experimental data from the literature were used to derive values of xi for screens of La2O2S:Tb, LaOBr:Tm and ZnCdS:Ag. The extinction factor was found to vary between -6 and +20%. The non-physical negative value for xi, found from one set of experiments on La2O2S:Tb screens, may be explained as resulting from a lack of accurate knowledge of the actual tube potential, influencing calculated values of the energy imparted to the screen. The results are promising but further well-controlled experiments (including improved dosimetric calculations to account forescape of K-radiation from the screen) are needed to confirm the model.

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The extrinsic (absolute) efficiency of a phosphor is expressed as the ratio of light energy emitted per unit area at the phosphor surface to incident x-ray energy fluence. A model described in earlier work has shown that by knowing the intrinsic efficiency, the particle size, the thickness and the light extinction factor ξ, it is possible to deduce the extrinsic efficiency for an extended range of particle sizes and layer thicknesses for a given design. The model has been tested on Gd 2 O 2 S:Tb and ZnS:Cu fluorescent layers utilized in two quality assurance devices, respectively, aimed for the assessment of light field and radiation field congruence in diagnostic radiology. The first unit is an established device based on both fluorescence and phosphorescence containing an x-ray sensitive phosphor (ZnS:Cu) screen comprising a long afterglow. Uncertainty in field edge position is estimated to 0.8 mm (k=2). The second unit is under development and based on a linear CCD sensor which is sensitized to x-rays by applying a Gd 2 O 2 S:Tb scintillator. The field profiles and the corresponding edge location are then obtained and compared. Uncertainty in field edge location is estimated to 0.1 mm (k=2).The properties of the radioluminescent layers are essential for the functionality of the devices and have been optimized utilizing the previously developed and verified model. A theoretical description of the maximization of phosphorescence is also briefly discussed as well as an interesting finding encountered during the development processes: focal spot wandering. The oversimplistic physical assumptions made in the radioluminescence model have not been found to lead the optimizing process astray. The obtained functionality is believed to be adequate within their respective limitations for both devices.