Reliability and quality control of photovoltaic (PV) plants increases in importance as the relevance of PV for the worldwide renewable energy production grows. In this study, a new method is presented which allows for a quantitative assessment of silicon PV module performance solely by relying on the cell temperatures measured via thermography (IR). A module temperature and power key figure are formulated and found to correlate very well with a linear relationship. The dependence of the deduced correlation's precision on measurement conditions is calculated and discussed. It facilitates decision‐making because optimal measurement conditions usually occur only very rarely, such that a compromise between data quality and measurement frequency has to be found. The power loss correlation presented in this paper may be used as part of a maintenance routine in order to ensure the best possible long‐term performance of the PV plant over its lifetime. The practical application in the field is outlined and explained.

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