Humans are visual animals, and imaging sensors that extend our reachcameras-have improved dramatically in recent times thanks to the introduction of CCD and CMOS digital technology. Consumer digital cameras in the megapixel range are now ubiquitous thanks to the happy coincidence that the semiconductor material of choice for large-scale electronics integration (silicon) also happens to readily convert photons at visual wavelengths into electrons. On the contrary, imaging at wavelengths where silicon is blind is considerably more complicated, bulky, and expensive. Thus, for comparable resolution, a US$500 digital camera for the visible becomes a US$50,000 camera for the infrared.In this article, we present a new approach to building simpler, smaller, and cheaper digital cameras that can operate efficiently across a much broader spectral range than conventional silicon-based cameras. Our approach fuses a new camera architecture

Abstract-Wideband analog signals push contemporary analogto-digital conversion (ADC) systems to their performance limits. In many applications, however, sampling at the Nyquist rate is inefficient because the signals of interest contain only a small number of significant frequencies relative to the band limit, although the locations of the frequencies may not be known a priori. For this type of sparse signal, other sampling strategies are possible. This paper describes a new type of data acquisition system, called a random demodulator, that is constructed from robust, readily available components. Let K denote the total number of frequencies in the signal, and let W denote its band limit in hertz. Simulations suggest that the random demodulator requires just O(K log(W=K)) samples per second to stably reconstruct the signal. This sampling rate is exponentially lower than the Nyquist rate of W hertz. In contrast to Nyquist sampling, one must use nonlinear methods, such as convex programming, to recover the signal from the samples taken by the random demodulator. This paper provides a detailed theoretical analysis of the system's performance that supports the empirical observations.

The Compressive Sensing (CS) framework aims to ease the burden on analog-to-digital converters (ADCs) by reducing the sampling rate required to acquire and stably recover sparse signals. Practical ADCs not only sample but also quantize each measurement to a finite number of bits; moreover, there is an inverse relationship between the achievable sampling rate and the bit-depth. In this paper, we investigate an alternative CS approach that shifts the emphasis from the sampling rate to the number of bits per measurement. In particular, we explore the extreme case of 1-bit CS measurements, which capture just their sign. Our results come in two flavors. First, we consider ideal reconstruction from noiseless 1-bit measurements and provide a lower bound on the best achievable reconstruction error. We also demonstrate that i.i.d. random Gaussian matrices provide measurement mappings that, with overwhelming probability, achieve nearly optimal error decay. Next, we consider reconstruction robustness to measurement errors and noise and introduce the Binary -Stable Embedding (B SE) property, which characterizes the robustness of the measurement process to sign changes. We show that the same class of matrices that provide almost optimal noiseless performance also enable such a robust mapping. On the practical side, we introduce the Binary Iterative Hard Thresholding (BIHT) algorithm for signal reconstruction from 1-bit measurements that offers state-of-the-art performance.

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