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International audienceA novel method is presented which allows accurate calculation of RF and microwave oscillator phase noise. A thorough frequency domain amplitude and phase noise equation is derived for arbitrary circuit topology. The method is based on envelope transient simulation technique. It also speeds up analysis of oscillator transients and circuits driven by chirp and frequency modulated signals

This presentation provides a historical perspective of the advances in statistical design methodologies for microwave design tools. We focus on some of the early efforts by John Bandler to turn his research advances into practical results. We describe the formulation of the yield optimization problem, in particular the powerful one-sided ℓ 1 objective function. We discuss modeling requirements to properly account for statistical variations in IC manufacturing. We also describe applications of yield sensitivities and design of experiments (DOE) as well as a recent technique for fast CMOS mismatch analysis.Index Terms -Design methodology, design for manufacture, design optimization, microwave theory and techniques, Monte Carlo methods, statistical analysis, yield estimation, CADCAM.

The development of simulation and macromodeling techniques for RF and microwave communication systems has been a high priority research subject for several years. If one observed this last years an impressive improvement of simulation tools performances, the full chip simulation of modern TX-RX chains remains a real stumbling block, as the transistor count has considerably increased. This paper discusses the hierarchical RF simulation issue using the same Harmonic Balance or Envelope Transient simulation engine for both transistor level description and circuit bloc macro-models. This method can reduce the size of the problem to enable accurate and fast simulation of large size circuits. The concept requires however to develop macro-modeling techniques taking into account impedance mismatch effects, which are discussed here.

In this paper, a relevant automated electromagnetic (EM) optimization method and a novel, fast, and accurate artificial neural network are proposed for the efficient CAD modeling of microwave circuits. We lay the groundwork for our investigation of radial wavelet neural networks WNNs trained by BFGS (Broyden‐Fletcher‐Goldfarb‐Shanno) and LBFGS (limited memory BFGS) algorithms and their application to determine the scattering parameters of the circuit under study. Wavelet theory may be exploited in deriving a good initialization for the neural network, and thus improved convergence of the learning algorithm. The optimization method combines a rigorous and accurate global EM analysis of device performed with a finite‐element method (FEM) and a fast neural model deduced from its segmented EM analysis. Finally, experimental results, which confirm the validity of the WNN model, and good agreement between theoretical optimization results and experimental ones are reported. ©1999 John Wiley & Sons, Inc. Int J RF and Microwave CAE 9: 297–306, 1999.