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-A handheld sheet resistance meter that can easily and quickly measure the sheet resistance of indium tin oxide films was developed. The dual-configuration four-point probe method was adopted for this instrument, which measured sheet resistance in the range from 0.26 Ω/sq. to 2.6 kΩ/sq. with 0.3 % ~ 0.5 % uncertainty. The screen of the instrument displayed the sheet resistance when the probe was in contact with the sample surface and the value continued to be displayed during the probe contact. Even after separating the probe from the surface, the value was still displayed on the screen and could be read easily. A feature of the instrument was the use of the dual-configuration technique to reduce edge effects markedly compared with the single-configuration technique and its ease of operation without applying correction factors for sample size and thickness.

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-The widely-used measurement methods for conductivity of non-magnetic metals are van der Pauw method, Two Point Probe method and Eddy Current method. Among them a more simpler and easier method is the Eddy Current method and an instrument using the method is a Conductivity Meter which can measure a conductivity by contacting its probe on a sample surface. However, conductivity standards are essentially needed to confirm the meter's performance or to calibrate it. In this study, six kinds of the standards which are made of Cu, Al-1, Al-2, brass, Zn and SUS-316 are developed and conductivity ranges for the standards are 2.27 %IACS ~ 101.6 %IACS with measurement uncertainty of less than 0.3 %.