This paper generalizes the dynamic binary state reliability parameters R(t), F(t), λ(t) and MTBF to corresponding dynamic multistate reliability parameter vectors R(t), F(t), λ(t) and M. Then, probability models for system lifetime used on binary state reliability models, such as exponential, Weibull, and other distributions are generalized for multistate models. Continuous time Markov process and Semi-Markov process are used to model the lifetime distribution for multistate system. Multistate reliability measures, such as R(t), F(t), λ(t), M are derived for those multistate reliability models.

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