Artificial defects such as notches and antinotches are often attached to magnetic nanowires to serve as trapping (pinning) sites for domain walls. The magnetic field necessary to release (depin) the trapped domain wall from the notch depends on the type, geometric shape, and dimensions of the defect but is typically quite large. Conversely we show here that for some notches and antinotches there exists a much smaller driving field for which a moving domain wall will travel past the defect without becoming trapped. This dynamic pinning field also depends on the type, geometric shape and defect dimensions. Micromagnetic simulation is used to investigate both the static and dynamic pinning fields and their relation to the topologic structure of the domain wall.

Domain walls in ferromagnetic nanowires are important for proposed devices in recording, logic, and sensing. The realization of such devices depends in part on the ability to quickly and accurately control the domain wall from creation until placement. Using micromagnetic computer simulation we demonstrate how a combination of externally applied magnetic fields is used to quickly inject, move, and accurately place multiple domain walls within a single wire for potential recording and logical operations. The use of a magnetic field component applied perpendicular to the principle domain wall driving field is found to be critical for increased speed and reliability. The effects of the transverse field on the injection and trapping of the domain wall will be shown to be of particular importance.

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